Scanning electron microscopy
Scanning electron microscopy - technique of electron microscopy in which the specimen is coated with heavy metal and then scanned by an electron beam. The resolution is not as great as with transmission electron microscopy, but preparation is easier (often by fixation followed by critical point drying), the depth of focus is relatively enormous, the surface of a specimen can be seen (though not the interior unless the specimen is cracked open) and the image is aesthetically pleasing.
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Source: Data courtesy of the U.S. National Library of Medicine. Since the data might have changed, please query MeSH on Scanning electron microscopy for any updates.
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