X-ray fluorescence

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LDAutoXRFPic
Fischer XRF machine
Handheld RXF analyzer gun
X-ray fluorescence simple figure
XRFScan

X-ray fluorescence (XRF) is a non-destructive testing technique used to determine the elemental composition of materials. XRF works by exposing a sample to a beam of X-rays. The atoms in the sample absorb energy from the X-rays, becoming excited and then emit secondary X-rays, known as fluorescence. The energy of the fluorescence is characteristic of specific elements, allowing for the identification and quantification of the elements within the sample.

Principles of X-ray Fluorescence[edit | edit source]

XRF analysis is based on the principle that individual atoms, when excited by an external energy source, emit X-ray photons of a characteristic energy or wavelength. This phenomenon is known as the Photoelectric effect. The energy of the emitted photon is specific to the element from which it originates, thus providing a unique "fingerprint" for that element. By measuring the intensity and energy of the emitted photons, it is possible to determine the composition and concentration of elements within the sample.

Excitation[edit | edit source]

In XRF, excitation is achieved by bombarding the sample with X-rays or gamma rays. There are two primary methods of excitation:

  • Primary fluorescence, where the source is typically an X-ray tube.
  • Secondary fluorescence, induced by gamma rays or X-rays from radioactive sources.

Detection[edit | edit source]

The emitted X-ray fluorescence is detected and analyzed by an energy-dispersive or wavelength-dispersive detector. Energy-dispersive detectors measure the energy of the photons, while wavelength-dispersive detectors separate the photons by their wavelength using a crystal diffraction technique.

Applications of X-ray Fluorescence[edit | edit source]

XRF is widely used in various industries and research fields due to its non-destructive nature and the detailed information it can provide about the elemental composition of a sample. Some common applications include:

Advantages and Limitations[edit | edit source]

Advantages[edit | edit source]

  • Non-destructive: Samples can be analyzed without alteration or damage.
  • Rapid and accurate: Provides quick results with high precision.
  • Versatile: Applicable to a wide range of materials and sample forms.

Limitations[edit | edit source]

  • Depth of analysis is limited, typically to the surface or near-surface region of the sample.
  • Heavy elements can overshadow the detection of lighter elements.
  • Requires calibration with standards for quantitative analysis.

Safety Considerations[edit | edit source]

While XRF is a non-destructive technique, it involves the use of X-rays, which are a form of ionizing radiation. Proper safety measures, including the use of shielding and adherence to regulatory guidelines, are essential to protect operators and bystanders from exposure.

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